Speaker
François Villar
(ESRF)
Description
I will give an overview of the design of experiment stations used at ESRF. I will explain how instruments combining mechanical, metrology, control and optical systems can be build to examine samples submitted to X-rays beam. I will focus on the mechanical design principles, the metrology system used to control the sample position and the correction of guiding errors of stages. Examples from various ESRF beamlines will be used to illustrate the presentation.
