Meeting on results from WEST C3 marker PFUs

Europe/Berlin
Description
    • 1
      Introduction
      Speaker: Antti Hakola (TEKES / VTT)
    • 2
      Overview of C3 marker PFUs and sample distribution
      Speakers: Dr Elodie Bernard, Dr Mathilde Diez (CEA)
      • Background information on the two C3 marker tiles that were handed over for surface analyses
      • Introduction of the s-coordinate system, distribution of core samples, and discussion on goals of this meeting
      • WEMA database for sample locations, instructions to the sent to all soon, first step is "technical passport" of the samples
    • 3
      Broad-beam RBS/NRA results: overview of erosion/deposition patterns (MPG)
      Speakers: Martin Balden (IPP), Matej Mayer (IPP)
      • NRA and RBS analyses: standard broad beam, measurements along central line, interval 12.5 mm
      • C3-34i: D, B, C, and O (indirectly) deposition profiles and W thickness changes determined (except for region with very thick deposits)
      • C3-22o: generally thinner deposits and strongly erosion-dominated region
      • NB! thick deposits after C4 have become even thicker --> potential issues in getting through them; in addition, peaks in terms of the s coordinates are shifted
      • D largely trapped in co-deposits but also in eroded regions in small depressions (shadowed from plasma) --> calls for micro NRA
    • 4
      Broad-beam PIXE/NRA/RBS results - correspondence to MPG results (JSI)
      Speakers: Mitja Kelemen (JSI), Sabina Markelj (JSI)
      • Broad beam analyses (PIXE, NRA) of selected core samples + comparison with MPG results; measurements also in the poloidal direction (=along the central line)
      • PIXE allows further insights into the concentrations of trace elements (like metallic impurities)
      • Relatively good agreement for NRA between IPP and JSI - except for C3-34iH (boundary region between thin and thick deposits) --> is this due to averaging over 5 successive measurement points? or delamination of the deposits partly or totally? Elzbieta and Martin says that removal locally is possible
      • Also W thicknesses differ (but this may be due to DAQ at JSI) --> action on Mitja to re-check
      • In addition, discrepancy of a factor of 1.5-2 between NRA data is large, should be only ~20% --> we should pay more attention to the cross-lab comparison! --> action on AH, MD, and EB to organize follow-up meetings!
    • 5
      Broad-beam PIXE/NRA/RBS results - correspondence to MPG results (IST)
      Speakers: Eduardo Alves, Rodrigo Mateus (IST)
      • Applied the JET analysis chamber, boron quantification challenging; 4 points per sample at every 3-4 mm (and deviating from SIMS spots toroidally by ~2 mm)
      • Strong deposits on C3-34iK --> consistent with MPG data --> action on Rodrigo to make a graphical comparison between MPG and IST and to determine how well they agree
      • For next set of marker samples, the Mo interlayer should be thicker (~3-4 times) --> would simplify analyses and interpretation
      • Cu available on some places, consistent with also microscopy analyses; stainless steel splashes visible as well --> due to arcing from SS panels (but very local phenomenon)
    • 6
      NRA results and correspondence to MPG results (NCSRD)
      Speaker: Konstantina Mergia (National Centre for Scientific Research “Demokritos”)
      • two samples analyzed; IBA with D beam and interpretation using SIMNRA --> mainly Mo and W profiles could be extracted, agreement within ~50%
      • SEM: indicates Fe and Cr, consistently with other observations; XRF: indicate their concentrations typically <0.3 at.% and generally <1 at.%
      • Samples may have some additional dust on the surfaces (no special cleaning performed) but anything else is related to the features of the deposits --> one has to pay attention to inhomogeneous distribution of particles and averaging of the obtained data
    • 7
      RBS and TOF-ERDA measurements: elemental footprint and layer thickness (RBI)
      Speaker: Ivancica Bogdanovic Radovic (RBI)
      • TOF-ERDA analyses of two samples, measurements along the central line, distance between spots ~3 mm; in addition, analyses in toroidal direction --> why this time little H visible on the samples (the latter set of measurements made 8 months after the first round)? Samples stored in desiccators but not in vacuum
      • Main problem: samples possibly too rough for fully reliable analyses
      • He on these samples just around the detection limit --> good reference case for comparing C4 results
      • Maybe escaping of H due to complex (and slow) boron chemistry? Observed F originating from the production process?
      • Action to repeat measurements closer to the original measurement point to see what really has happened in the meantime
    • 8
      TOF-ERDA and NRA measurements: elemental footprint and fuel content (VR)
      Speaker: Per Petersson (VR)
      • TOF-ERDA and NRA analyses performed; NRA may have not revealed all D retained in the deposits
      • Interesting to re-measure the samples but one has to keep in mind the complexities related to analyses --> then to see if similar H problems as in Iva's case arise
    • 9
      GDOES and XPS measurements: elemental footprint and layer thickness (IAP)
      Speaker: Dr Eduard Grigore
      • GDOES depth profiles for W, Mo, C and B extracted (integrated over a large area ~ 4 mm spot); XPS data (top surface only) available for more detailed B quantification
      • Results seem to be in line with MPG data --> with the issue of the surface
    • 10
      SIMS results for elemental depth profiles (VTT)
      Speaker: Antti Hakola (TEKES / VTT)
      • Action to send original data (non-normalized with respect to W) to Mathilde & Elodie
    • 11
      LIBS results for elemental depth profiles (UT)
      Speakers: Dr Jogi Indrek, Dr Peeter Paris
      • LIBS measurements performed for selected samples, ablation rate ~100 nm/shot; large noise levels for Mo and W profiles, impurities only visible for the first 3-4 shots
      • Action to make SIMS/LIBS comparison and consider analysing one sample from region with thick deposits by LIBS
    • 12
      Discussion
    • 13
      SEM/EDX results for overview of surface modifications (MPG)
      Speakers: Martin Balden (IPP), Matej Mayer (IPP)
      • Overview of microscopy measurements given
      • Thick deposits experienced delamination and peeling off; crack network visible as well
      • In strongly eroded area only remnants of Mo left (erosion > 1 micron)
      • Arcing also could lead to delamination, arcs burn through coating; weak arcing, in contrast, have led to no measurable depth of the arc traces and indicate deposition outside of the arc features
      • Some analyses made for the side faces of tiles (=poloidal gaps)
    • 14
      SEM/EDX and FIB measurements: surface structure and microscale compositions (IPPLM)
      Speaker: Elzbieta Fortuna-Zalesna (IPPLM)
      • Microscopy studies of selected inner and outer divertor tiles
      • No big differences observed between outer-divertor samples; no issues with marker-layer adhesion seen
      • Inner-divertor samples from different characteristic regions: Mo reaches the surface in stripes on the erosion-dominated zone, flaky surfaces in the region with thick stratified deposits, Cu etc. can be seen in the deposits and not only on the surface
      • Matej: quantitative information? fraction of pores in a particular deposit? What could be gained from this?
      • Interesting reference case with respect to analysis of C4 samples
    • 15
      SEM/EDX and XRF measurements: surface structure and microscale compositions (NCSRD)
      Speaker: Konstantina Mergia (National Centre for Scientific Research “Demokritos”)
    • 16
      XRF measurements: surface structure and microscale compositions (IAP)
      Speakers: Dr Eduard Grigore, Dr Ion Tiseanu
      • XRF measurements (microtomography) of the samples sent to IAP
      • W thickness evaluated (overall W thickness, not only that of the markers), comparison with SEM OK
    • 17
      Discussion
    • 18
      Final remarks and future actions
      Speaker: Antti Hakola (TEKES / VTT)